Advanced Course Atomic Force Microscopy (AFM): Theory and Practice
10.11.2011- 10-11 November 2011 - Empa, Dübendorf
This course will feature hands-on training for optimising AFM measurements, including techniques for high resolution magnetic force microscopy, non-contact AFM, magnetic force microscopy, combination of AFM and ToF-SIMS techniques, and application of AFM to corrosion and electrochemistry.
The programme and the course brochure are available for download here.
Course Content
- Introduction to AFM and its application to different research areas for students and researchers from industry.
- AFM principles and applications in bioscience.
- Best practices and improvement of the participants' AFM experience in the laboratory, focusing on:
- various AFM operation modes such as contact, intermittent contact, true non-contact in vacuum, peak force friction force, high speed AFM.
- measuring different forces including contact, van der Waals, electrostatic (Kelvin) , magnetic.
- instruments of different manufacturers including Bruker, NanoScan, Nanosurf.
- different samples including calibration grids, microstructured samples, polymer blends, hard disks.
Registration
Registration is closed.
Registration is limited to a maximum of 18 participants in order to maximise the hands-on experience.
Registration deadline is Thursday 20 October 2011.
Course participants will be eligible for ECTS credit.
Participation Fees
- 100 CHF for doctoral students, CCMX industrial members and for academic researchers from Swiss universities and research institutions
- 700 CHF for all other participants
For further information, please contact Chiara Corticelli.
Acknowledgements
The CCMX course "Atomic Force Microscopy: theory and practice" is strongly supported by the following companies (in alphabetical order) who contribute their products for the hands-on training within this course:
- Bruker
- NanoScan
- Nanosurf