NMMC Workshop on Nanoanalyses

09.05.08- This workshop aims to demonstrate the wide-range of possibilities in using nanoscale analyses within a variety of fields.

2 October 2008 - 10:00 to 18:00         (Initially scheduled for 16 June - postponed)

Empa Akademie, Überlandstrasse 129, CH-8600 Dübendorf


NMMC is an analytical platform that brings together state-of-the-art analytical resources from all the participating institutions. The platform focuses on projects designed to develop new tools for the analysis of physical, chemical or biological properties on the scale below 100 nm and on the development of existing methods for new application fields. The purchase of analytical equipment is encouraged, provided that the equipment will be made available to potential users of other laboratories within the ETH domain institutions and CSEM. In addition, several projects are supported by CCMX to carry out a variety of well-defined experiments with existing equipment (RAPs-Rapid analytical Projects). Thanks to this extensive funding strategy, the NMMC platform caters for a wide range of demands concerning materials analysis at the nano- and microscale.

The aim of this meeting is to present some of the applications of these techniques to interested parties from both industry and academia. The presentations have been chosen to demonstrate the wide-ranging possibilities of utilising nanoscale analyses in a variety of fields.

Programme

09:30 Registration

10:00 Introduction, CCMX Platform

10:30 Nanoanalysis with Synchrotron Radiation: Making the Invisible Visible by Christoph Quitmann

11:30 Characterisation of surface chemistry with ToF-SIMS by Beat Keller und Karl Meyerhofer

 

12:15 Lunch

13:15 Surface analysis with TEM by Roger Albert Wepf

13:45 Tickling cells on the nano-scale: life science atomic force microscopy by Boris Hinz

14:30 Coffee break

14:50 SUL: The Swiss Scanning Probe User Laboratory by Rowena Crockett

15:00 Technical Surfaces under the AFM : advantages and disadvantages compared to conventional microscopy by Peter Reimann

15:30 Surface processes in controlled atmospheres investigated by AFM techniques by Patrick Schmutz, Daniel Reiss & Joern Lübben

16:00 Morphology of organic semiconducting blend films by Jakob Heier

16:30 Apéro

 

Registration Fee: 150 CHF

Website for registration: click here

Download the brochure here


For more information please contact:

Chiara Corticelli

Empa
Überlandstrasse 129
CH-8600 Dübendorf
Tel. 044 823 4482
email

Rowena Crockett

Empa
Überlandstrasse 129
CH-8600 Dübendorf
Tel. 044 823 4612
email

CCMX


EPFL STI
Bâtiment MX
Station 12
CH-1015 Lausanne
Tel. + 41 21 693 46 56
Questions? E-mail us.